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JEOL JEM-3010

JEOL JEM-3010

Location: Science and Engineering South, 116C

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  Unassisted Assisted
(1 hr)
UIC Cost $38 (per hour) $76 (per hour)
Other Academic $60 (per hour) $120 (per hour)
Non-Academic$159 (per hour) $240 (per hour)

Description

The Materials Science TEM, the JEM-3010, is a 300kV transmission electron microscope with a LaB6 electron source which was installed in 1998. It is fitted with an ultra-high resolution pole piece.

Images are collected using a Gatan digital imaging system with a Windows XP computer running Digital Micrograph software. There are two cameras, an intensified TV camera for set up and a multi-scan 1Kx1K CCD camera.


The microscope is also fitted with a Thermo Noran Vantage XEDS system with a light element X-ray detector.


Heating (1000 deg C) and cooling (-170 deg C) stages are available for this instrument.

Technical Specifications

  • Resolution: 0.14nm lattice, 0.17nm point-to-point.
  • Accelerating Voltage: 100, 150, 200, 250, 300kV.
  • Objective lens: focal length 2.5mm, Cs 0.6mm, Cc 1.3mm, minimum focus step 1nm.
  • Spot Size: TEM mode 200~20nm dia (5 steps), EDS/NBD/CBD mode 25~1.0nm (8 steps).
  • Magnification Range: 4,000x - 1,500,000x.
  • Camera length range: 120 - 3,000mm.
  • Specimen Tilt range +/-20 degrees (X & Y).
  • Specimen movement: 2mm (X,Y), 0.2mm (Z)