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| Model No.: | S-3000N |
| Manufacturer: | Hitachi |
| Location: | MSB, E5G |
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The Hitachi S-3000N is a Variable Pressure SEM with a tungsten electron
source and is capable of imaging specimens at high vacuum and also in a
variable pressure range from 1-270 Pa. In the variable pressure range,
non-conducting specimens can be imaged without coating with a conductive
film. The accelerating voltage can be varied over the range 0.3-30kV with
a resolution at 25kV of 3.5nm in high vacuum and 5nm in variable pressure
mode. The magnification range is 15x to 300Kx. The microscope has an
Oxford Inca EDX system with a light element X-ray detector (15mm WD) and
has spectrum imaging software which allows a spectrum to be collected at
each point in a map allowing selection of elements to be mapped during
acquisition.
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