Model No.: JEM-3010 Manufacturer: JEOL Location: SES, 116C

The JEOL JEM-3010 is a 300kV transmission electron microscope with a LaB6 electron source. It is fitted with an ultra-high resolution pole piece, which results in a lattice resolution of 0.14nm (point resolution 0.17nm). The magnification range is 50x to 1,500,000x. Images are collected on a Gatan digital imaging system with a Power Mac 8600 computer running Digital Micrograph software. There are two cameras, an intensified TV camera for set up and a multi-scan CCD camera. The microscope is also fitted with a ThermoNoran Vista EDX system with a light element X-ray detector. It was installed in 1998.