Model No.: JEM-2010F FasTEM Manufacturer: JEOL Location: SES, 104A

The JEOL JEM-2010F FasTEM is a 200kV field emission transmission electron microscope with a Schottky field emission electron source. It is the first of its kind specified to operate primarily in the STEM mode. It is fitted with an ultra-high resolution pole piece, which in STEM mode is capable of producing a probe size of 0.13nm with 15pA of current. Magnifications in excess of 10,000,000x are possible in this mode. An annular dark field detector allows Z contrast images in STEM with an imaging resolution equal to the probe size. In conventional TEM mode the lattice resolution is 0.1nm (point resolution 0.19nm), with a magnification range from 50x to 1,500,000x. The microscope is fitted with a piezo-driven stage to counteract specimen drift. Analytical capabilities include a Noran Vista EDX system with a light element detector, drift correction and spectrum imaging, and a Gatan imaging filter (GIF) which allows EELS and energy filtered imaging.